Scanning tunnelling microscopy of suspended graphene.
نویسندگان
چکیده
Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.
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ورودعنوان ژورنال:
- Nanoscale
دوره 4 10 شماره
صفحات -
تاریخ انتشار 2012